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1 Ergebnisse
1
Chip Demonstration of a High-Density (43Gb) and High-Search..:
, In:
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
,
Hsieh, Chih-Chang
;
Lue, Hang-Ting
;
Li, Yung-Chun
... - p. 1-2 , 2023
Link:
https://doi.org/10.23919/VLSITechnologyandCir57934.202..
RT T1 <cTitle>2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)</cTitle>: T1 <Title>Chip Demonstration of a High-Density (43Gb) and High-Search-Bandwidth (300Gb/s) 3D NAND Based In-Memory Search Accelerator for Ternary Content Addressable Memory (TCAM) and Proximity Search of Hamming Distance</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10185361&Exemplar=1&LAN=DE A1 Hsieh, Chih-Chang A1 Lue, Hang-Ting A1 Li, Yung-Chun A1 Hung, Shuo-Nan A1 Hung, Chun-Hsiung A1 Wang, Keh-Chung A1 Lu, Chih-Yuan YR 2023 SN 2158-9682 K1 Semiconductor device measurement K1 Associative memory K1 Three-dimensional displays K1 Power measurement K1 Impedance matching K1 Current measurement K1 Bandwidth SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185361 DO https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185361 SF ELIB - SuUB Bremen
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