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1 Ergebnisse
1
Upcoming Challenges of ESD Reliability in DTCO with BS-PDN ..:
, In:
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
,
Chen, W.-C.
;
Chen, S.-H.
;
Veloso, A.
... - p. 1-2 , 2023
Link:
https://doi.org/10.23919/VLSITechnologyandCir57934.202..
RT T1 <cTitle>2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)</cTitle>: T1 <Title>Upcoming Challenges of ESD Reliability in DTCO with BS-PDN Routing via BPRs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10185389&Exemplar=1&LAN=DE A1 Chen, W.-C. A1 Chen, S.-H. A1 Veloso, A. A1 Serbulova, K. A1 Hellings, G. A1 Groeseneken, G. YR 2023 SN 2158-9682 K1 Degradation K1 Layout K1 Logic gates K1 Very large scale integration K1 Conductivity K1 Electrostatic discharges K1 Routing SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185389 DO https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185389 SF ELIB - SuUB Bremen
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