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1 Ergebnisse
1
Novel Strategies for Highly Uniform and Reliable Cell Chara..:
, In:
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
,
Lee, Changhwan
;
Yu, Min-Tai
;
Park, Sejun
... - p. 1-2 , 2023
Link:
https://doi.org/10.23919/VLSITechnologyandCir57934.202..
RT T1 <cTitle>2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)</cTitle>: T1 <Title>Novel Strategies for Highly Uniform and Reliable Cell Characteristics of 8th Generation 1Tb 3D-NAND Flash Memory</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10185390&Exemplar=1&LAN=DE A1 Lee, Changhwan A1 Yu, Min-Tai A1 Park, Sejun A1 Lee, Hoki A1 Kim, Bio A1 Lim, Suhwan A1 Lee, Jaeduk A1 Lee, Sung-Hun A1 Park, Mincheol A1 Ahn, Su Jin A1 Hur, Sung Hoi YR 2023 SN 2158-9682 K1 Degradation K1 Stacking K1 Interference K1 Very large scale integration K1 Etching K1 Silicon K1 Reliability SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185390 DO https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185390 SF ELIB - SuUB Bremen
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