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1 Ergebnisse
1
Long-time-constant leaky-integrating oxygen-vacancy drift-d..:
, In:
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
,
Inoue, Hisashi
;
Tamura, Hiroto
;
Kitoh, Ai
... - p. 1-2 , 2023
Link:
https://doi.org/10.23919/VLSITechnologyandCir57934.202..
RT T1 <cTitle>2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)</cTitle>: T1 <Title>Long-time-constant leaky-integrating oxygen-vacancy drift-diffusion FET for human-interactive spiking reservoir computing</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10185412&Exemplar=1&LAN=DE A1 Inoue, Hisashi A1 Tamura, Hiroto A1 Kitoh, Ai A1 Chen, Xiangyu A1 Byambadorj, Zolboo A1 Yajima, Takeaki A1 Hotta, Yasushi A1 Iizuka, Tetsuya A1 Tanaka, Gouhei A1 Inoue, Isao H. YR 2023 SN 2158-9682 K1 Backpropagation K1 Neurons K1 MIMICs K1 Field effect transistors K1 External stimuli K1 Information processing K1 Very large scale integration K1 reservoir computing K1 drift diffusion K1 spiking neural network K1 anomaly detection K1 oxygen vacancy SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185412 DO https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185412 SF ELIB - SuUB Bremen
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