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1 Ergebnisse
1
Breakthrough Design Technology Co-optimization using BSPDN ..:
, In:
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
,
Lee, Seungyoung
;
Jung, Sungyup
;
Jang, Yunkyeong
... - p. 1-2 , 2023
Link:
https://doi.org/10.23919/VLSITechnologyandCir57934.202..
RT T1 <cTitle>2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)</cTitle>: T1 <Title>Breakthrough Design Technology Co-optimization using BSPDN and Standard Cell Variants for Maximizing Block-level PPA</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10185417&Exemplar=1&LAN=DE A1 Lee, Seungyoung A1 Jung, Sungyup A1 Jang, Yunkyeong A1 Do, Jungho A1 Yu, Jisu A1 You, Hyeoungyu A1 Jeong, Minjae A1 Lim, Jinyoung A1 Han, Jiyun A1 Park, Sangdo A1 Kim, Yongdeok A1 Kwon, Jooyeon A1 Kim, Hoonki A1 Yoon, Seiseung YR 2023 SN 2158-9682 K1 Resistance K1 Layout K1 Very large scale integration K1 Lead K1 Market research K1 Routing K1 Capacitance SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185417 DO https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185417 SF ELIB - SuUB Bremen
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