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An Indirect Time-of-Flight CMOS Image Sensor Achieving Sub-..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),

Park, Jiheon ; Kim, Daeyun ; Lee, Hoyong... - p. 1-2 , 2023

Link: https://doi.org/10.23919/VLSITechnologyandCir57934.202..

RT 
T1 <cTitle>2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)</cTitle>: T1 <Title>An Indirect Time-of-Flight CMOS Image Sensor Achieving Sub-ms Motion Lagging and 60fps Depth Image from On-chip ISP</Title>

UL https://suche.suub.uni-bremen.de/peid=ieee-10185418&Exemplar=1&LAN=DE
				
A1 Park, Jiheon
A1 Kim, Daeyun
A1 Lee, Hoyong
A1 Shin, Seung-Chul
A1 Ki, Myoungoh
A1 Chung, Bumsik
A1 Bae, Myunghan
A1 Kye, Myeonggyun
A1 Ahn, Jonghan
A1 Song, Inho
A1 Lee, Sunhwa
A1 An, Jaeil
A1 Hwang, Il-Pyeong
A1 An, Taemin
A1 Jin, Young-Gu
A1 Kim, Youngchan
A1 Oh, Youngsun
A1 Ko, Juhyun
A1 Lee, Haechang
A1 Yim, JoonSeo
YR 2023
SN 2158-9682
K1 Optical device fabrication
K1 Dynamics
K1 Very large scale integration
K1 CMOS image sensors
K1 Optical imaging
K1 CMOS process
K1 Real-time systems
SP 1
OP 2
LK http://dx.doi.org/https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185418
DO https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185418
SF ELIB - SuUB Bremen

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