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1 Ergebnisse
1
Scaling-CIM: An eDRAM-based In-Memory-Computing Accelerator..:
, In:
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
,
Kim, Sangiin
;
Um, Soyeon
;
Jo, Wooyoung
... - p. 1-2 , 2023
Link:
https://doi.org/10.23919/VLSITechnologyandCir57934.202..
RT T1 <cTitle>2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)</cTitle>: T1 <Title>Scaling-CIM: An eDRAM-based In-Memory-Computing Accelerator with Dynamic-Scaling ADC for SQNR-Boosting and Layer-wise Adaptive Bit-Truncation</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10185439&Exemplar=1&LAN=DE A1 Kim, Sangiin A1 Um, Soyeon A1 Jo, Wooyoung A1 Lee, Jingu A1 Ha, Sangwoo A1 Li, Zhiyong A1 Yoo, Hoi-Jun YR 2023 SN 2158-9682 K1 Very large scale integration K1 Benchmark testing K1 CMOS technology K1 Boosting K1 Energy efficiency SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185439 DO https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185439 SF ELIB - SuUB Bremen
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