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1 Ergebnisse
1
Benchmarking Measurement-Based Large-Signal FET Models for ..:
, In:
2023 IEEE Radio Frequency Integrated Circuits Symposium (RFIC)
,
Martinez, Rafael Perez
;
Iwamoto, Masaya
;
Xu, Jianjun
.. - p. 69-72 , 2023
Link:
https://doi.org/10.1109/RFIC54547.2023.10186170
RT T1 <cTitle>2023 IEEE Radio Frequency Integrated Circuits Symposium (RFIC)</cTitle>: T1 <Title>Benchmarking Measurement-Based Large-Signal FET Models for GaN HEMT Devices</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10186170&Exemplar=1&LAN=DE A1 Martinez, Rafael Perez A1 Iwamoto, Masaya A1 Xu, Jianjun A1 Pahl, Philipp A1 Chowdhury, Srabanti YR 2023 SN 2375-0995 K1 Neural networks K1 Switches K1 HEMTs K1 Logic gates K1 Benchmark testing K1 Radiofrequency integrated circuits K1 Data models K1 GaN HEMT K1 device modeling K1 linearity K1 neural networks K1 thermal effects K1 trapping effects SP 69 OP 72 LK http://dx.doi.org/https://doi.org/10.1109/RFIC54547.2023.10186170 DO https://doi.org/10.1109/RFIC54547.2023.10186170 SF ELIB - SuUB Bremen
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