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1 Ergebnisse
1
Probability of Failure due to Electrochemical Migration on ..:
, In:
2023 IMAPS Nordic Conference on Microelectronics Packaging (NordPac)
,
Bahrebar, Sajjad
;
Ambat, Rajan
- p. 1-9 , 2023
Link:
https://doi.org/10.23919/NordPac58023.2023.10186221
RT T1 <cTitle>2023 IMAPS Nordic Conference on Microelectronics Packaging (NordPac)</cTitle>: T1 <Title>Probability of Failure due to Electrochemical Migration on Surface Mount Capacitor under Electrolyte Condition with same Contamination and Conductivity Level</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10186221&Exemplar=1&LAN=DE A1 Bahrebar, Sajjad A1 Ambat, Rajan YR 2023 K1 Low voltage K1 Capacitors K1 Surface mount technology K1 Voltage K1 High-voltage techniques K1 Conductivity K1 Packaging K1 electrochemical migration K1 time to failure K1 probability of failure K1 surface mount capacitor K1 contamination type and level K1 conductivity SP 1 OP 9 LK http://dx.doi.org/https://doi.org/10.23919/NordPac58023.2023.10186221 DO https://doi.org/10.23919/NordPac58023.2023.10186221 SF ELIB - SuUB Bremen
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