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Scenario-Based Approach to Systematically Derive Test Cases..:

, In: 2023 IEEE International Conference on Electro Information Technology (eIT),
Nyakundi, Nicholas B. N. ; Reynolds, Shawn M. ; Reza, Hassan - p. 051-058 , 2023
Link: https://doi.org/10.1109/eIT57321.2023.10187246