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1 Ergebnisse
1
AI-Based Localization and Classification of Visual Anomalie..:
, In:
2023 IEEE International Conference on Electro Information Technology (eIT)
,
Le, Minh Khai
;
Chia, Jason Zi Jie
;
Peskes, Dennis
- p. 122-126 , 2023
Link:
https://doi.org/10.1109/eIT57321.2023.10187356
RT T1 <cTitle>2023 IEEE International Conference on Electro Information Technology (eIT)</cTitle>: T1 <Title>AI-Based Localization and Classification of Visual Anomalies on Semiconductor Devices</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10187356&Exemplar=1&LAN=DE A1 Le, Minh Khai A1 Chia, Jason Zi Jie A1 Peskes, Dennis YR 2023 SN 2154-0373 K1 Integrated circuits K1 Performance evaluation K1 Visualization K1 Semiconductor device measurement K1 Manufacturing processes K1 Semiconductor devices K1 Quality control SP 122 OP 126 LK http://dx.doi.org/https://doi.org/10.1109/eIT57321.2023.10187356 DO https://doi.org/10.1109/eIT57321.2023.10187356 SF ELIB - SuUB Bremen
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