I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
GaN HEMT Modeling versus Bias Point and Gate Width:
, In:
2023 58th International Scientific Conference on Information, Communication and Energy Systems and Technologies (ICEST)
,
Crupi, Giovanni
;
Latino, Mariangela
;
Gugliandolo, Giovanni
... - p. 211-214 , 2023
Link:
https://doi.org/10.1109/ICEST58410.2023.10187364
RT T1
2023 58th International Scientific Conference on Information, Communication and Energy Systems and Technologies (ICEST)
: T1
GaN HEMT Modeling versus Bias Point and Gate Width
UL https://suche.suub.uni-bremen.de/peid=ieee-10187364&Exemplar=1&LAN=DE A1 Crupi, Giovanni A1 Latino, Mariangela A1 Gugliandolo, Giovanni A1 Marinkovic, Zlatica A1 Cai, Jialin A1 Fazio, Enza A1 Donato, Nicola YR 2023 K1 Silicon carbide K1 Scattering K1 Energy measurement K1 HEMTs K1 Predictive models K1 Logic gates K1 Frequency measurement K1 Bias point K1 Equivalent circuit K1 Gate width K1 GaN K1 HEMT K1 Microwave frequency K1 Scattering parameter measurements SP 211 OP 214 LK http://dx.doi.org/https://doi.org/10.1109/ICEST58410.2023.10187364 DO https://doi.org/10.1109/ICEST58410.2023.10187364 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)