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1 Ergebnisse
1
RF Reliability of SiGe and InP HBTs: A Comparative Study:
, In:
2023 IEEE/MTT-S International Microwave Symposium - IMS 2023
,
Weimer, Christoph
;
Muller, Markus
;
Vardarli, Eren
.. - p. 8-11 , 2023
Link:
https://doi.org/10.1109/IMS37964.2023.10187940
RT T1 <cTitle>2023 IEEE/MTT-S International Microwave Symposium - IMS 2023</cTitle>: T1 <Title>RF Reliability of SiGe and InP HBTs: A Comparative Study</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10187940&Exemplar=1&LAN=DE A1 Weimer, Christoph A1 Muller, Markus A1 Vardarli, Eren A1 Claus, Martin A1 Schroter, Michael YR 2023 SN 2576-7216 K1 Radio frequency K1 Performance evaluation K1 Resistance K1 Heterojunction bipolar transistors K1 III-V semiconductor materials K1 Integrated circuit reliability K1 Indium phosphide K1 RF reliability K1 SiGe HBT K1 InP HBT K1 electrical stress K1 transistor degradation K1 breakdown SP 8 OP 11 LK http://dx.doi.org/https://doi.org/10.1109/IMS37964.2023.10187940 DO https://doi.org/10.1109/IMS37964.2023.10187940 SF ELIB - SuUB Bremen
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