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1 Ergebnisse
1
Broadband THz Switching with Extremely Low Insertion Loss a..:
, In:
2023 IEEE/MTT-S International Microwave Symposium - IMS 2023
,
Li, Peizhao
;
Wu, Weifeng
;
Shi, Yu
... - p. 688-691 , 2023
Link:
https://doi.org/10.1109/IMS37964.2023.10187994
RT T1 <cTitle>2023 IEEE/MTT-S International Microwave Symposium - IMS 2023</cTitle>: T1 <Title>Broadband THz Switching with Extremely Low Insertion Loss and Superior Isolation</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10187994&Exemplar=1&LAN=DE A1 Li, Peizhao A1 Wu, Weifeng A1 Shi, Yu A1 Deng, Yijing A1 Fay, Patrick A1 Liu, Lei YR 2023 SN 2576-7216 K1 Semiconductor device measurement K1 Wavelength measurement K1 Switches K1 Insertion loss K1 Transmission line measurements K1 Silicon K1 Coplanar waveguides K1 millimeter wave switches K1 optically controlled modulation K1 terahertz switches SP 688 OP 691 LK http://dx.doi.org/https://doi.org/10.1109/IMS37964.2023.10187994 DO https://doi.org/10.1109/IMS37964.2023.10187994 SF ELIB - SuUB Bremen
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