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1 Ergebnisse
1
A Thru-Reflect-Series-Resistance (TRS) Calibration for Cryo..:
, In:
2023 IEEE/MTT-S International Microwave Symposium - IMS 2023
,
Chen, Yi-Ting
;
Huang, Ian
;
Lin, Min-Jui
... - p. 1203-1206 , 2023
Link:
https://doi.org/10.1109/IMS37964.2023.10188078
RT T1
2023 IEEE/MTT-S International Microwave Symposium - IMS 2023
: T1
A Thru-Reflect-Series-Resistance (TRS) Calibration for Cryogenic Device Characterization in 40-nm CMOS Technology
UL https://suche.suub.uni-bremen.de/peid=ieee-10188078&Exemplar=1&LAN=DE A1 Chen, Yi-Ting A1 Huang, Ian A1 Lin, Min-Jui A1 Chuang, Shu-Yan A1 Ho, Hua Ling A1 Hsu, Kai-Syang A1 Lin, Pin-Yu A1 Chen, Sih-Ying A1 Lu, Liang-Hung A1 Chen, Shih-Yuan A1 Li, Jiun-Yun A1 Chien, Jun-Chau YR 2023 SN 2576-7216 K1 Semiconductor device modeling K1 Resistors K1 Temperature dependence K1 Cryogenics K1 CMOS process K1 Calibration K1 Probes K1 vector network analyzer K1 calibration K1 TRL K1 LRRM K1 series resistance K1 cryogenic temperature K1 qubits K1 device modeling SP 1203 OP 1206 LK http://dx.doi.org/https://doi.org/10.1109/IMS37964.2023.10188078 DO https://doi.org/10.1109/IMS37964.2023.10188078 SF ELIB - SuUB Bremen
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