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Use of Cavity Perturbation Techniques to Characterize Via-P..:

, In: 2023 IEEE/MTT-S International Microwave Symposium - IMS 2023,
Reeves, Tim ; Tsuk, Michael ; Iyer, Vishwanath - p. 709-712 , 2023
Link: https://doi.org/10.1109/IMS37964.2023.10188163