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1 Ergebnisse
1
An All-Electronically-Scanned Antenna Measurement Technique..:
, In:
2023 IEEE/MTT-S International Microwave Symposium - IMS 2023
,
Lin, Yuan-Chun
;
Shin, Ting Hao
;
Chang, Yu-Teng
... - p. 923-926 , 2023
Link:
https://doi.org/10.1109/IMS37964.2023.10188179
RT T1 <cTitle>2023 IEEE/MTT-S International Microwave Symposium - IMS 2023</cTitle>: T1 <Title>An All-Electronically-Scanned Antenna Measurement Technique for Rapid Performance Characterization by Using a Circular Array of Reflection Surfaces</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10188179&Exemplar=1&LAN=DE A1 Lin, Yuan-Chun A1 Shin, Ting Hao A1 Chang, Yu-Teng A1 Chang, Chia-Chan A1 Lin, Shih-Cheng A1 Chang, Sheng-Fuh YR 2023 SN 2576-7216 K1 Antenna measurements K1 Microwave measurement K1 Phased arrays K1 Microwave antennas K1 Production K1 Gain measurement K1 Reflector antennas K1 mmWave K1 reflectarray K1 antenna measurement system K1 rapid measurement K1 all-electronically scanned antenna pattern measurement technique (AESAP) SP 923 OP 926 LK http://dx.doi.org/https://doi.org/10.1109/IMS37964.2023.10188179 DO https://doi.org/10.1109/IMS37964.2023.10188179 SF ELIB - SuUB Bremen
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