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1 Ergebnisse
1
An Integrated Silicon Nanowire Field Emission Electron Sour..:
, In:
2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)
,
Buchner, Philipp
;
Hausladen, Matthias
;
Schels, Andreas
... - p. 6-8 , 2023
Link:
https://doi.org/10.1109/IVNC57695.2023.10188878
RT T1
2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)
: T1
An Integrated Silicon Nanowire Field Emission Electron Source on a Chip with High Electron Transmission
UL https://suche.suub.uni-bremen.de/peid=ieee-10188878&Exemplar=1&LAN=DE A1 Buchner, Philipp A1 Hausladen, Matthias A1 Schels, Andreas A1 Herdl, Florian A1 Edler, Simon A1 Bachmann, Michael A1 Schreiner, Rupert YR 2023 SN 2380-6311 K1 Semiconductor device measurement K1 Stimulated emission K1 Optical device fabrication K1 Glass K1 Power system stability K1 Insulators K1 Electron optics K1 Field Emission K1 Field Emission Array K1 Silicon Field Emission K1 High Transmission K1 Electron Source SP 6 OP 8 LK http://dx.doi.org/https://doi.org/10.1109/IVNC57695.2023.10188878 DO https://doi.org/10.1109/IVNC57695.2023.10188878 SF ELIB - SuUB Bremen
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