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1 Ergebnisse
1
Distribution Modelling for Yield Analysis using Variational..:
, In:
2023 International Symposium on Signals, Circuits and Systems (ISSCS)
,
Carbunescu-Stoenescu, B.
;
David, E.
;
Topa, M.
.. - p. 1-5 , 2023
Link:
https://doi.org/10.1109/ISSCS58449.2023.10190853
RT T1 <cTitle>2023 International Symposium on Signals, Circuits and Systems (ISSCS)</cTitle>: T1 <Title>Distribution Modelling for Yield Analysis using Variational Autoencoders</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10190853&Exemplar=1&LAN=DE A1 Carbunescu-Stoenescu, B. A1 David, E. A1 Topa, M. A1 Buzo, A. A1 Pelz, G. YR 2023 K1 Analytical models K1 Manufacturing processes K1 Circuits and systems K1 Production K1 Bayes methods K1 Yield estimation K1 Integrated circuit modeling K1 yield estimation K1 density estimation K1 variational autoencoder SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/ISSCS58449.2023.10190853 DO https://doi.org/10.1109/ISSCS58449.2023.10190853 SF ELIB - SuUB Bremen
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