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1 Ergebnisse
1
Experimental Study and Comparison of Switching Loss Behavio..:
, In:
2023 IEEE International Conference on Environment and Electrical Engineering and 2023 IEEE Industrial and Commercial Power Systems Europe (EEEIC / I&CPS Europe)
,
Bhakare, Onkar
;
Ghosh, Kousik
;
Chakraborty, Surja Sekhar
. - p. 1-6 , 2023
Link:
https://doi.org/10.1109/EEEIC/ICPSEurope57605.2023.101..
RT T1
2023 IEEE International Conference on Environment and Electrical Engineering and 2023 IEEE Industrial and Commercial Power Systems Europe (EEEIC / I&CPS Europe)
: T1
Experimental Study and Comparison of Switching Loss Behavior of Si IGBT and SiC MOSFET in Dual Active Bridge Series Resonant Converter
UL https://suche.suub.uni-bremen.de/peid=ieee-10194837&Exemplar=1&LAN=DE A1 Bhakare, Onkar A1 Ghosh, Kousik A1 Chakraborty, Surja Sekhar A1 Hatua, Kamalesh YR 2023 K1 Insulated gate bipolar transistors K1 Bridges K1 MOSFET K1 Silicon carbide K1 Switching loss K1 Resonant frequency K1 Resonant converters K1 SiC MOSFET K1 IGBT K1 Dual Active Bridge Series resonant converter (DABSRC) K1 Zero Current Switching (ZCS) SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/EEEIC/ICPSEurope57605.2023.10194837 DO https://doi.org/10.1109/EEEIC/ICPSEurope57605.2023.10194837 SF ELIB - SuUB Bremen
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