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A Novel Approach to Measure and Characterize Radiation Patt..:

, In: 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC),

Jogalekar, Aditya N. ; Medina, Oscar F. ; Iyer, Mahadevan K.... - p. 498-503 , 2023

Link: https://doi.org/10.1109/ECTC51909.2023.00089

RT 
T1 <cTitle>2023 IEEE 73rd Electronic Components and Technology Conference (ECTC)</cTitle>: T1 <Title>A Novel Approach to Measure and Characterize Radiation Patterns of Antenna-in-Package</Title>

UL https://suche.suub.uni-bremen.de/peid=ieee-10195299&Exemplar=1&LAN=DE
				
A1 Jogalekar, Aditya N.
A1 Medina, Oscar F.
A1 Iyer, Mahadevan K.
A1 Blanchard, Andrew
A1 Henderson, Rashaunda
A1 Murugan, Rajen
A1 Bakshi, Harshpreet
A1 Ali, Hassan
YR 2023
SN 2377-5726
K1 Antenna measurements
K1 Waveguide transitions
K1 Antenna-in-package
K1 Bandwidth
K1 Transmission line measurements
K1 Attenuation
K1 Time measurement
K1 Antenna-in-package (AiP)
K1 two and three layer flip-chip enhanced QFN (FCeQFN) package
K1 slot bowtie (SBT) antenna
K1 signal transition methodology using coupled patch
K1 chip-to-package interconnects
K1 waveguide-launch-in-package (W-liP)
SP 498
OP 503
LK http://dx.doi.org/https://doi.org/10.1109/ECTC51909.2023.00089
DO https://doi.org/10.1109/ECTC51909.2023.00089
SF ELIB - SuUB Bremen

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