I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Reliability Performance of S-Connect Module (Bridge Technol..:
, In:
2023 IEEE 73rd Electronic Components and Technology Conference (ECTC)
,
Jang, Heejun
;
Ahn, Kyun
;
Park, Haesung
... - p. 1027-1031 , 2023
Link:
https://doi.org/10.1109/ECTC51909.2023.00175
RT T1
2023 IEEE 73rd Electronic Components and Technology Conference (ECTC)
: T1
Reliability Performance of S-Connect Module (Bridge Technology) for Heterogeneous Integration Packaging
UL https://suche.suub.uni-bremen.de/peid=ieee-10195345&Exemplar=1&LAN=DE A1 Jang, Heejun A1 Ahn, Kyun A1 Park, Haesung A1 Yong, Gamhan A1 Kim, Jihyun A1 Jeong, YeonKi A1 Sohn, EunSook A1 Hiner, Dave A1 Kelly, Mike A1 Hwang, Taekyeong A1 Do, Wonchul A1 Khim, JinYoung YR 2023 SN 2377-5726 K1 Thermal resistance K1 Bridge circuits K1 Multichip modules K1 Silicon K1 Power system reliability K1 System-on-chip K1 Soldering K1 S-Connect K1 Bridge technology K1 Heterogeneous integration K1 Reliability SP 1027 OP 1031 LK http://dx.doi.org/https://doi.org/10.1109/ECTC51909.2023.00175 DO https://doi.org/10.1109/ECTC51909.2023.00175 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)