I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Lithographic Performance and Insulation Reliability of a No..:
, In:
2023 IEEE 73rd Electronic Components and Technology Conference (ECTC)
,
Inoue, Go
;
Yukimori, Daiki
;
Shibasaki, Kaho
... - p. 44-48 , 2023
Link:
https://doi.org/10.1109/ECTC51909.2023.00016
RT T1 <cTitle>2023 IEEE 73rd Electronic Components and Technology Conference (ECTC)</cTitle>: T1 <Title>Lithographic Performance and Insulation Reliability of a Novel i-Line Photosensitive Dielectric Material</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10195503&Exemplar=1&LAN=DE A1 Inoue, Go A1 Yukimori, Daiki A1 Shibasaki, Kaho A1 Okuda, Ayano A1 Ishikawa, Nobuhiro A1 Han, Young-Gun A1 Kanayama, Taka A1 Suetsugu, Tadashi A1 Ogata, Toshiyuki YR 2023 SN 2377-5726 K1 Resistance K1 Insulation K1 Micrometers K1 Dielectric materials K1 Electronic components K1 Materials reliability K1 Life estimation K1 fine-pitch RDLs K1 negative-tone K1 photosensitive dielectric material K1 DOF simulation K1 insulation reliability SP 44 OP 48 LK http://dx.doi.org/https://doi.org/10.1109/ECTC51909.2023.00016 DO https://doi.org/10.1109/ECTC51909.2023.00016 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
