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1 Ergebnisse
1
Characterization of Packaging, Electronic, and Photonic Mat..:
, In:
2023 IEEE 73rd Electronic Components and Technology Conference (ECTC)
,
Lewis, Christopher J.
;
Marchio, Jacob D.
;
Sellers, Drew
. - p. 2230-2234 , 2023
Link:
https://doi.org/10.1109/ECTC51909.2023.00386
RT T1
2023 IEEE 73rd Electronic Components and Technology Conference (ECTC)
: T1
Characterization of Packaging, Electronic, and Photonic Materials at Cryogenic Temperatures Using a Multi-Angle Backscattering Mueller-Matrix Ellipsometer
UL https://suche.suub.uni-bremen.de/peid=ieee-10195717&Exemplar=1&LAN=DE A1 Lewis, Christopher J. A1 Marchio, Jacob D. A1 Sellers, Drew A1 Hamilton, Michael C. YR 2023 SN 2377-5726 K1 Gold K1 Temperature distribution K1 Instruments K1 Cryogenics K1 Packaging K1 Vibration measurement K1 Thermal noise K1 ellipsometry K1 cryogenic K1 return-path K1 RPE K1 null-incidence K1 backscattering K1 thin-film SP 2230 OP 2234 LK http://dx.doi.org/https://doi.org/10.1109/ECTC51909.2023.00386 DO https://doi.org/10.1109/ECTC51909.2023.00386 SF ELIB - SuUB Bremen
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