I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Control of Solder Microstructure Stimulated by Interface Co..:
, In:
2023 IEEE 73rd Electronic Components and Technology Conference (ECTC)
,
Mohanram, Hariram
;
Kim, Yiram
;
Ni, Geng
... - p. 1060-1065 , 2023
Link:
https://doi.org/10.1109/ECTC51909.2023.00181
RT T1
2023 IEEE 73rd Electronic Components and Technology Conference (ECTC)
: T1
Control of Solder Microstructure Stimulated by Interface Condition of the UBM/Solder and Enhancement of Electromigration Reliability
UL https://suche.suub.uni-bremen.de/peid=ieee-10195744&Exemplar=1&LAN=DE A1 Mohanram, Hariram A1 Kim, Yiram A1 Ni, Geng A1 Kim, Choong-Un A1 Ankamah-Kusi, Sylvester A1 Chen, Qiao A1 Thompson, Patrick YR 2023 SN 2377-5726 K1 Electromigration K1 Electronic components K1 Lead K1 Surface texture K1 Kinetic theory K1 Reliability K1 Microstructure K1 solder Interconnects K1 electromigration reliability K1 Nickel K1 Sn grain orientation K1 substrate effect SP 1060 OP 1065 LK http://dx.doi.org/https://doi.org/10.1109/ECTC51909.2023.00181 DO https://doi.org/10.1109/ECTC51909.2023.00181 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)