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BiSPD-YOLO: Surface Defect Detection Method for Small Featu..:

, In: 2023 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (AIM),
Yan, Sixu ; Chen, Gaoming ; Gao, Ao.. - p. 709-714 , 2023
Link: https://doi.org/10.1109/AIM46323.2023.10196194