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1 Ergebnisse
1
Identifying Coincidental Correct Test Cases with Multiple F..:
, In:
2023 IEEE 47th Annual Computers, Software, and Applications Conference (COMPSAC)
,
Wu, Yonghao
;
Tian, Shuaihua
;
Yang, Zezhong
... - p. 800-809 , 2023
Link:
https://doi.org/10.1109/COMPSAC57700.2023.00109
RT T1 <cTitle>2023 IEEE 47th Annual Computers, Software, and Applications Conference (COMPSAC)</cTitle>: T1 <Title>Identifying Coincidental Correct Test Cases with Multiple Features Extraction for Fault Localization</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10196979&Exemplar=1&LAN=DE A1 Wu, Yonghao A1 Tian, Shuaihua A1 Yang, Zezhong A1 Li, Zheng A1 Liu, Yong A1 Chen, Xiang YR 2023 K1 Location awareness K1 Fault diagnosis K1 Deep learning K1 Machine learning algorithms K1 Software algorithms K1 Feature extraction K1 Software K1 software debugging K1 spectrum-based fault localization K1 coincidental correct test case K1 features extraction K1 machine learning SP 800 OP 809 LK http://dx.doi.org/https://doi.org/10.1109/COMPSAC57700.2023.00109 DO https://doi.org/10.1109/COMPSAC57700.2023.00109 SF ELIB - SuUB Bremen
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