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1 Ergebnisse
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A zero dead-time front-end channel in 28 nm CMOS for future..:
, In:
IEEE EUROCON 2023 - 20th International Conference on Smart Technologies
,
Galliani, A.
;
Gaioni, L.
;
Manghisoni, M.
... - p. 128-132 , 2023
Link:
https://doi.org/10.1109/EUROCON56442.2023.10198951
RT T1 <cTitle>IEEE EUROCON 2023 - 20th International Conference on Smart Technologies</cTitle>: T1 <Title>A zero dead-time front-end channel in 28 nm CMOS for future high energy physics detectors</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10198951&Exemplar=1&LAN=DE A1 Galliani, A. A1 Gaioni, L. A1 Manghisoni, M. A1 Re, V. A1 Riceputi, E. A1 Traversi, G. YR 2023 K1 Fabrication K1 High energy physics K1 Circuit simulation K1 Data acquisition K1 Prototypes K1 Detectors K1 CMOS technology K1 Front-end electronics K1 28 nm CMOS K1 Future HEP experiments K1 zero dead-time SP 128 OP 132 LK http://dx.doi.org/https://doi.org/10.1109/EUROCON56442.2023.10198951 DO https://doi.org/10.1109/EUROCON56442.2023.10198951 SF ELIB - SuUB Bremen
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