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1 Ergebnisse
1
Device Analysis of Vertically Stacked GAA Nanosheet FET at ..:
, In:
2023 3rd International Conference on Advances in Computing, Communication, Embedded and Secure Systems (ACCESS)
,
Kumar, Aruru Sai
;
Deekshana, M.
;
Sreenivasulu, V. Bharath
.. - p. 274-279 , 2023
Link:
https://doi.org/10.1109/ACCESS57397.2023.10199820
RT T1
2023 3rd International Conference on Advances in Computing, Communication, Embedded and Secure Systems (ACCESS)
: T1
Device Analysis of Vertically Stacked GAA Nanosheet FET at Advanced Technology Node
UL https://suche.suub.uni-bremen.de/peid=ieee-10199820&Exemplar=1&LAN=DE A1 Kumar, Aruru Sai A1 Deekshana, M. A1 Sreenivasulu, V. Bharath A1 Kumari, N. Aruna A1 Shanthi, G. YR 2023 K1 Performance evaluation K1 MOSFET K1 Visualization K1 Gallium arsenide K1 Switches K1 Logic gates K1 Ions K1 FinFET K1 nanowire K1 nanosheet K1 Subthreshold Swing K1 DIBL SP 274 OP 279 LK http://dx.doi.org/https://doi.org/10.1109/ACCESS57397.2023.10199820 DO https://doi.org/10.1109/ACCESS57397.2023.10199820 SF ELIB - SuUB Bremen
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