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1 Ergebnisse
1
High Performance EDA and LDA Analysis: An Application for W..:
, In:
2023 3rd International Conference on Advances in Computing, Communication, Embedded and Secure Systems (ACCESS)
,
Kumar, Deepak
;
Kumar, Yash
;
Kukreja, Vinay
.. - p. 163-167 , 2023
Link:
https://doi.org/10.1109/ACCESS57397.2023.10200446
RT T1 <cTitle>2023 3rd International Conference on Advances in Computing, Communication, Embedded and Secure Systems (ACCESS)</cTitle>: T1 <Title>High Performance EDA and LDA Analysis: An Application for Wheat Yield Estimation</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10200446&Exemplar=1&LAN=DE A1 Kumar, Deepak A1 Kumar, Yash A1 Kukreja, Vinay A1 Bansal, Ankit A1 Bhattacherjee, Abhishek YR 2023 K1 Training K1 Casting K1 Data analysis K1 Pesticides K1 Predictive models K1 Linear discriminant analysis K1 Ensemble learning K1 Wheat crop K1 Machine learning K1 LDA K1 EDA K1 Decision tree K1 Environment impact K1 Intercropping K1 Precision SP 163 OP 167 LK http://dx.doi.org/https://doi.org/10.1109/ACCESS57397.2023.10200446 DO https://doi.org/10.1109/ACCESS57397.2023.10200446 SF ELIB - SuUB Bremen
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