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1 Ergebnisse
1
A Fully-Numerical Environment for Evaluating the Robustness..:
, In:
2023 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO)
,
Richert, D.
;
Kaja, K.
;
Moran-Meza, J. A.
... - p. 133-135 , 2023
Link:
https://doi.org/10.1109/NEMO56117.2023.10202380
RT T1 <cTitle>2023 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO)</cTitle>: T1 <Title>A Fully-Numerical Environment for Evaluating the Robustness of the Short Open Load Calibration for Capacitance Measurements in Scanning Microwave Microscopy</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10202380&Exemplar=1&LAN=DE A1 Richert, D. A1 Kaja, K. A1 Moran-Meza, J. A. A1 Gautier, B. A1 Deleruyelle, D. A1 Piquemal, F. YR 2023 SN 2575-4769 K1 Microwave measurement K1 Impedance measurement K1 Shape K1 Shape measurement K1 Electrostatic measurements K1 Capacitance K1 Capacitance measurement K1 SMM K1 FEM-simulations K1 tip apex geometry K1 self-calibration SP 133 OP 135 LK http://dx.doi.org/https://doi.org/10.1109/NEMO56117.2023.10202380 DO https://doi.org/10.1109/NEMO56117.2023.10202380 SF ELIB - SuUB Bremen
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