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Modeling of THz Detection in JLFETs - A Comparative Study:
, In:
2023 30th International Conference on Mixed Design of Integrated Circuits and System (MIXDES)
,
Tomaszewski, Daniel
;
Zaborowski, Michal
;
Marczewski, Jacek
. - p. 37-41 , 2023
Link:
https://doi.org/10.23919/MIXDES58562.2023.10203229
RT T1 <cTitle>2023 30th International Conference on Mixed Design of Integrated Circuits and System (MIXDES)</cTitle>: T1 <Title>Modeling of THz Detection in JLFETs - A Comparative Study</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10203229&Exemplar=1&LAN=DE A1 Tomaszewski, Daniel A1 Zaborowski, Michal A1 Marczewski, Jacek A1 Bajurko, Pawel YR 2023 K1 MOSFET K1 Thermionic emission K1 Radiation detectors K1 Plasmons K1 Integrated circuit modeling K1 FET K1 JLFET K1 THz K1 THz detector K1 plasmon K1 resistive mixing K1 thermoemission SP 37 OP 41 LK http://dx.doi.org/https://doi.org/10.23919/MIXDES58562.2023.10203229 DO https://doi.org/10.23919/MIXDES58562.2023.10203229 SF ELIB - SuUB Bremen
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