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Polarimetric iToF: Measuring High-Fidelity Depth Through Sc..:

, In: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR),
Jeon, Daniel S. ; Meuleman, Andreas ; Baek, Seung-Hwan. - p. 12353-12362 , 2023
Link: https://doi.org/10.1109/CVPR52729.2023.01189