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ResUnet-GAN with Dynamic Memory for Mura Defect Detection:

, In: 2023 IEEE International Conference on Industry 4.0, Artificial Intelligence, and Communications Technology (IAICT),
Lin, Chia-Yu ; Lin, Pin-Fan ; Chung, Wei-Kuang. - p. 350-353 , 2023
Link: https://doi.org/10.1109/IAICT59002.2023.10205662