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1 Ergebnisse
1
ACE: An Analog Cell Emulator for Dependability Study of NAN..:
, In:
2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks - Supplemental Volume (DSN-S)
,
Lee, Jeoungwon
;
Park, Heekwon
;
Choi, Gunhee
... - p. 28-34 , 2023
Link:
https://doi.org/10.1109/DSN-S58398.2023.00021
RT T1
2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks - Supplemental Volume (DSN-S)
: T1
ACE: An Analog Cell Emulator for Dependability Study of NAND Flash Memory
UL https://suche.suub.uni-bremen.de/peid=ieee-10206808&Exemplar=1&LAN=DE A1 Lee, Jeoungwon A1 Park, Heekwon A1 Choi, Gunhee A1 Kim, Bryan S. A1 Yoo, Seehwan A1 Lee, Jaedong A1 Choi, Jongmoo YR 2023 SN 2833-292X K1 Performance evaluation K1 Solid modeling K1 Power demand K1 Emulation K1 Reliability engineering K1 Threshold voltage K1 Error correction codes K1 Flash memory K1 Analog cell emulator K1 Noise modeling K1 Reliability enhancement techniques SP 28 OP 34 LK http://dx.doi.org/https://doi.org/10.1109/DSN-S58398.2023.00021 DO https://doi.org/10.1109/DSN-S58398.2023.00021 SF ELIB - SuUB Bremen
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