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1
An Experimental Analysis of RowHammer in HBM2 DRAM Chips:
, In:
2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks - Supplemental Volume (DSN-S)
,
Olgun, Ataberk
;
Osseiran, Majd
;
Yaglikci, A. Giray
... - p. 151-156 , 2023
Link:
https://doi.org/10.1109/DSN-S58398.2023.00042
RT T1 <cTitle>2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks - Supplemental Volume (DSN-S)</cTitle>: T1 <Title>An Experimental Analysis of RowHammer in HBM2 DRAM Chips</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10206905&Exemplar=1&LAN=DE A1 Olgun, Ataberk A1 Osseiran, Majd A1 Yaglikci, A. Giray A1 Tugrul, Yahya Can A1 Luo, Haocong A1 Rhyner, Steve A1 Salami, Behzad A1 Luna, Juan Gomez A1 Mutlu, Onur YR 2023 SN 2833-292X K1 Bit error rate K1 DRAM chips K1 Safety K1 Security K1 Reliability SP 151 OP 156 LK http://dx.doi.org/https://doi.org/10.1109/DSN-S58398.2023.00042 DO https://doi.org/10.1109/DSN-S58398.2023.00042 SF ELIB - SuUB Bremen
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