I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Characterization and Exploration of Latch Checkers for Effi..:
, In:
2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks - Supplemental Volume (DSN-S)
,
Swaminathan, Karthik
;
Bertran, Ramon
;
Balazich, Doug
... - p. 63-69 , 2023
Link:
https://doi.org/10.1109/DSN-S58398.2023.00026
RT T1
2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks - Supplemental Volume (DSN-S)
: T1
Characterization and Exploration of Latch Checkers for Efficient RAS Protection
UL https://suche.suub.uni-bremen.de/peid=ieee-10207007&Exemplar=1&LAN=DE A1 Swaminathan, Karthik A1 Bertran, Ramon A1 Balazich, Doug A1 Buyuktosunoglu, Alper A1 Haran, Arvind A1 Carey, Sean A1 Anderson, Karl A1 Jacobson, Hans A1 Pflanz, Matthias A1 Bose, Pradip YR 2023 SN 2833-292X K1 Program processors K1 Runtime K1 Latches K1 Measurement uncertainty K1 Reliability engineering K1 Hardware K1 Timing K1 Reliability K1 Soft Errors K1 Timing errors K1 Parity checkers) SP 63 OP 69 LK http://dx.doi.org/https://doi.org/10.1109/DSN-S58398.2023.00026 DO https://doi.org/10.1109/DSN-S58398.2023.00026 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)