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1 Ergebnisse
1
Measuring Improvement of F1-Scores in Detection of Self-Adm..:
, In:
2023 ACM/IEEE International Conference on Technical Debt (TechDebt)
,
Aiken, William
;
Mvula, Paul K.
;
Branco, Paula
... - p. 37-41 , 2023
Link:
https://doi.org/10.1109/TechDebt59074.2023.00011
RT T1 <cTitle>2023 ACM/IEEE International Conference on Technical Debt (TechDebt)</cTitle>: T1 <Title>Measuring Improvement of F1-Scores in Detection of Self-Admitted Technical Debt</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10207102&Exemplar=1&LAN=DE A1 Aiken, William A1 Mvula, Paul K. A1 Branco, Paula A1 Jourdan, Guy-Vincent A1 Sabetzadeh, Mehrdad A1 Viktor, Herna YR 2023 K1 Deep learning K1 Bit error rate K1 Pipelines K1 Computer architecture K1 Transformers K1 Natural language processing K1 Data models K1 technical debt K1 natural language processing K1 transformers K1 empirical evaluation SP 37 OP 41 LK http://dx.doi.org/https://doi.org/10.1109/TechDebt59074.2023.00011 DO https://doi.org/10.1109/TechDebt59074.2023.00011 SF ELIB - SuUB Bremen
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