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1 Ergebnisse
1
Lot-to-Lot Variability and TID degradation of Bipolar Trans..:
, In:
2023 IEEE Space Computing Conference (SCC)
,
Martin-Holgado, Pedro
;
Romero-Maestre, Amor
;
de-Martin-Hernandez, Jose
... - p. 13-21 , 2023
Link:
https://doi.org/10.1109/SCC57168.2023.00012
RT T1
2023 IEEE Space Computing Conference (SCC)
: T1
Lot-to-Lot Variability and TID degradation of Bipolar Transistors Analyzed with ESA and PRECEDER Databases
UL https://suche.suub.uni-bremen.de/peid=ieee-10207293&Exemplar=1&LAN=DE A1 Martin-Holgado, Pedro A1 Romero-Maestre, Amor A1 de-Martin-Hernandez, Jose A1 Krimmel, Florian A1 Borel, Thomas A1 Muschitiello, Michele A1 Costantino, Alessandra A1 Tonicello, Ferdinando A1 Poivey, Christian A1 Pesce, Anastasia A1 Ramos, Olga A1 Dominguez, Manuel A1 Morilla, Yolanda YR 2023 K1 Degradation K1 Bipolar transistors K1 Costs K1 Databases K1 Statistical analysis K1 Radiation hardening (electronics) K1 Standards K1 Coefficient of variation K1 COTS K1 database K1 gamma K1 lot-to-lot variability K1 NewSpace K1 radiation SP 13 OP 21 LK http://dx.doi.org/https://doi.org/10.1109/SCC57168.2023.00012 DO https://doi.org/10.1109/SCC57168.2023.00012 SF ELIB - SuUB Bremen
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