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1 Ergebnisse
1
Diversified and Multi-Class Controllable Industrial Defect ..:
, In:
2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)
,
Wei, Jing
;
Shen, Fei
;
Lv, Chengkan
... - p. 4445-4453 , 2023
Link:
https://doi.org/10.1109/CVPRW59228.2023.00467
RT T1 <cTitle>2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)</cTitle>: T1 <Title>Diversified and Multi-Class Controllable Industrial Defect Synthesis for Data Augmentation and Transfer</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10208648&Exemplar=1&LAN=DE A1 Wei, Jing A1 Shen, Fei A1 Lv, Chengkan A1 Zhang, Zhengtao A1 Zhang, Feng A1 Yang, Huabin YR 2023 SN 2160-7516 K1 Deep learning K1 Image segmentation K1 Annotations K1 Modulation K1 Metals K1 Interference K1 Inspection SP 4445 OP 4453 LK http://dx.doi.org/https://doi.org/10.1109/CVPRW59228.2023.00467 DO https://doi.org/10.1109/CVPRW59228.2023.00467 SF ELIB - SuUB Bremen
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