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1 Ergebnisse
1
Fast Local Thickness:
, In:
2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)
,
Dahl, Vedrana Andersen
;
Dahl, Anders Bjorholm
- p. 4336-4344 , 2023
Link:
https://doi.org/10.1109/CVPRW59228.2023.00456
RT T1
2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)
: T1
Fast Local Thickness
UL https://suche.suub.uni-bremen.de/peid=ieee-10208668&Exemplar=1&LAN=DE A1 Dahl, Vedrana Andersen A1 Dahl, Anders Bjorholm YR 2023 SN 2160-7516 K1 Histograms K1 Computer vision K1 Three-dimensional displays K1 Statistical analysis K1 Microscopy K1 Conferences K1 Pattern recognition SP 4336 OP 4344 LK http://dx.doi.org/https://doi.org/10.1109/CVPRW59228.2023.00456 DO https://doi.org/10.1109/CVPRW59228.2023.00456 SF ELIB - SuUB Bremen
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