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1 Ergebnisse
1
Simulation Analysis of Post-arc Sheath Development Process ..:
, In:
2023 6th International Conference on Electronics Technology (ICET)
,
Zhang, Xining
;
Li, Hua
;
Song, Zhiquan
... - p. 836-841 , 2023
Link:
https://doi.org/10.1109/ICET58434.2023.10211446
RT T1 <cTitle>2023 6th International Conference on Electronics Technology (ICET)</cTitle>: T1 <Title>Simulation Analysis of Post-arc Sheath Development Process of VCB in QPS</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10211446&Exemplar=1&LAN=DE A1 Zhang, Xining A1 Li, Hua A1 Song, Zhiquan A1 Xu, Meng A1 Xu, Qianglin A1 Jiang, Qian YR 2023 SN 2768-6515 K1 Analytical models K1 Vacuum systems K1 Simulation K1 Interrupters K1 Numerical simulation K1 Dielectrics K1 Numerical models K1 vacuum circuit breaker K1 quench protection system K1 Continuous transition model K1 Recovery voltage K1 Sheath width SP 836 OP 841 LK http://dx.doi.org/https://doi.org/10.1109/ICET58434.2023.10211446 DO https://doi.org/10.1109/ICET58434.2023.10211446 SF ELIB - SuUB Bremen
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