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1 Ergebnisse
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Characterization of Single-Poly EEPROM in 0.18μm BCD(Bipola..:
, In:
2023 6th International Conference on Electronics Technology (ICET)
,
Gao, Ruibin
;
Li, Zhen
;
Xu, Jun
- p. 366-370 , 2023
Link:
https://doi.org/10.1109/ICET58434.2023.10211490
RT T1 <cTitle>2023 6th International Conference on Electronics Technology (ICET)</cTitle>: T1 <Title>Characterization of Single-Poly EEPROM in 0.18μm BCD(Bipolar-CMOS-DMOS) Technology</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10211490&Exemplar=1&LAN=DE A1 Gao, Ruibin A1 Li, Zhen A1 Xu, Jun YR 2023 SN 2768-6515 K1 Couplings K1 Performance evaluation K1 Costs K1 Automation K1 Nonvolatile memory K1 EPROM K1 Tunneling K1 embedded nonvolatile memory (eNVM) K1 Single-Poly EEPROM K1 BCD technology SP 366 OP 370 LK http://dx.doi.org/https://doi.org/10.1109/ICET58434.2023.10211490 DO https://doi.org/10.1109/ICET58434.2023.10211490 SF ELIB - SuUB Bremen
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