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1 Ergebnisse
1
High Speed Column Level ADC Design with TDC Technology for ..:
, In:
2023 6th International Conference on Electronics Technology (ICET)
,
Wang, Yangle
;
Guo, Zhongjie
;
Guo, Youmei
... - p. 180-184 , 2023
Link:
https://doi.org/10.1109/ICET58434.2023.10212063
RT T1 <cTitle>2023 6th International Conference on Electronics Technology (ICET)</cTitle>: T1 <Title>High Speed Column Level ADC Design with TDC Technology for CMOS Image Sensor</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10212063&Exemplar=1&LAN=DE A1 Wang, Yangle A1 Guo, Zhongjie A1 Guo, Youmei A1 Xu, Ruiming A1 Wang, Bing A1 Liu, Suiyang YR 2023 SN 2768-6515 K1 Power demand K1 Voltage K1 CMOS image sensors K1 CMOS process K1 Switching circuits K1 Signal to noise ratio K1 Sensor arrays K1 fully parallel K1 two-step K1 TDC technology K1 column-level ADC SP 180 OP 184 LK http://dx.doi.org/https://doi.org/10.1109/ICET58434.2023.10212063 DO https://doi.org/10.1109/ICET58434.2023.10212063 SF ELIB - SuUB Bremen
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