I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Verification of Hygrothermal Simulations Using Silicone Enc..:
, In:
2023 11th International Conference on Power Electronics and ECCE Asia (ICPE 2023 - ECCE Asia)
,
Frohling, Soren
;
Kostka, Benedikt
;
Wenzel, Johannes C.
... - p. 1361-1369 , 2023
Link:
https://doi.org/10.23919/ICPE2023-ECCEAsia54778.2023.1..
RT T1
2023 11th International Conference on Power Electronics and ECCE Asia (ICPE 2023 - ECCE Asia)
: T1
Verification of Hygrothermal Simulations Using Silicone Encapsulated Climate Sensors in Continuously Operated IGBT Power Modules
UL https://suche.suub.uni-bremen.de/peid=ieee-10213687&Exemplar=1&LAN=DE A1 Frohling, Soren A1 Kostka, Benedikt A1 Wenzel, Johannes C. A1 Fischer, Katharina A1 Peters, Jan-Hendrik A1 Hanf, Michael A1 Zorn, Christian A1 Dehning, Kirsten A1 Zimmermann, Stefan A1 Kaminski, Nando A1 Mertens, Axel YR 2023 SN 2150-6086 K1 Temperature measurement K1 Insulated gate bipolar transistors K1 Semiconductor device measurement K1 Power measurement K1 Pulse measurements K1 Asia K1 Multichip modules K1 Degradation K1 IGBT K1 Reliability K1 Silicone gel SP 1361 OP 1369 LK http://dx.doi.org/https://doi.org/10.23919/ICPE2023-ECCEAsia54778.2023.10213687 DO https://doi.org/10.23919/ICPE2023-ECCEAsia54778.2023.10213687 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)