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1 Ergebnisse
1
Degradation Diagnosis During Active Power Cycling via Frequ..:
, In:
2023 11th International Conference on Power Electronics and ECCE Asia (ICPE 2023 - ECCE Asia)
,
Kalker, Sven
;
Holz, Johannes
;
Austrup, Isabel
. - p. 1342-1348 , 2023
Link:
https://doi.org/10.23919/ICPE2023-ECCEAsia54778.2023.1..
RT T1 <cTitle>2023 11th International Conference on Power Electronics and ECCE Asia (ICPE 2023 - ECCE Asia)</cTitle>: T1 <Title>Degradation Diagnosis During Active Power Cycling via Frequency-Domain Thermal Impedance Spectroscopy</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10213859&Exemplar=1&LAN=DE A1 Kalker, Sven A1 Holz, Johannes A1 Austrup, Isabel A1 De Doncker, Rik W. YR 2023 SN 2150-6086 K1 Degradation K1 Insulated gate bipolar transistors K1 Spectroscopy K1 Frequency-domain analysis K1 Multichip modules K1 Aging K1 Lead K1 active thermal cycling K1 degradation diagnosis K1 monitoring K1 impedance spectroscopy K1 NTC SP 1342 OP 1348 LK http://dx.doi.org/https://doi.org/10.23919/ICPE2023-ECCEAsia54778.2023.10213859 DO https://doi.org/10.23919/ICPE2023-ECCEAsia54778.2023.10213859 SF ELIB - SuUB Bremen
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