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1 Ergebnisse
1
Domain Transfer for Surface Defect Detection using Few-Shot..:
, In:
2023 IEEE 21st International Conference on Industrial Informatics (INDIN)
,
Gerschner, Felix
;
Paul, Jonas
;
Schmid, Lukas
... - p. 1-7 , 2023
Link:
https://doi.org/10.1109/INDIN51400.2023.10217859
RT T1 <cTitle>2023 IEEE 21st International Conference on Industrial Informatics (INDIN)</cTitle>: T1 <Title>Domain Transfer for Surface Defect Detection using Few-Shot Learning on Scarce Data</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10217859&Exemplar=1&LAN=DE A1 Gerschner, Felix A1 Paul, Jonas A1 Schmid, Lukas A1 Barthel, Nico A1 Gouromichos, Victor A1 Schmid, Florian A1 Atzmueller, Martin A1 Theissler, Andreas YR 2023 SN 2378-363X K1 Training K1 Transfer learning K1 Data models K1 Product design K1 Robustness K1 Quality assessment K1 Manufacturing K1 few-shot learning K1 scarce data K1 transfer learning K1 surface defect detection K1 industrial defect inspection K1 explainable AI SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/INDIN51400.2023.10217859 DO https://doi.org/10.1109/INDIN51400.2023.10217859 SF ELIB - SuUB Bremen
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