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Improved Flaky Test Detection with Black-Box Approach and T..:

, In: 2023 IEEE Symposium on Computers and Communications (ISCC),
Carmo, David ; Goncalves, Luisa ; Dias, Ana. - p. 245-251 , 2023
Link: https://doi.org/10.1109/ISCC58397.2023.10217934