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1 Ergebnisse
1
Benchmarking Artificial Neural Network Models for Design Te..:
, In:
2023 International Symposium of Electronics Design Automation (ISEDA)
,
Dai, Wu
;
Li, Yu
;
Peng, Baokang
... - p. 423-427 , 2023
Link:
https://doi.org/10.1109/ISEDA59274.2023.10218514
RT T1 <cTitle>2023 International Symposium of Electronics Design Automation (ISEDA)</cTitle>: T1 <Title>Benchmarking Artificial Neural Network Models for Design Technology Co-optimization</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10218514&Exemplar=1&LAN=DE A1 Dai, Wu A1 Li, Yu A1 Peng, Baokang A1 Zhang, Lining A1 Wang, Runsheng A1 Huang, Ru YR 2023 K1 Training K1 Circuit simulation K1 Artificial neural networks K1 Benchmark testing K1 Predictive models K1 Data models K1 Libraries K1 Compact model K1 Artificial neural network K1 Semiconductor device simulation SP 423 OP 427 LK http://dx.doi.org/https://doi.org/10.1109/ISEDA59274.2023.10218514 DO https://doi.org/10.1109/ISEDA59274.2023.10218514 SF ELIB - SuUB Bremen
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