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1 Ergebnisse
1
Fast and Accurate Electromigration Analysis of Multi-Segmen..:
, In:
2023 International Symposium of Electronics Design Automation (ISEDA)
,
Zuo, Yunfan
;
Ye, Yuyang
;
Yan, Hao
. - p. 340-344 , 2023
Link:
https://doi.org/10.1109/ISEDA59274.2023.10218655
RT T1 <cTitle>2023 International Symposium of Electronics Design Automation (ISEDA)</cTitle>: T1 <Title>Fast and Accurate Electromigration Analysis of Multi-Segment Wires</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10218655&Exemplar=1&LAN=DE A1 Zuo, Yunfan A1 Ye, Yuyang A1 Yan, Hao A1 Shi, Longxing YR 2023 K1 Electromigration K1 Runtime K1 Wires K1 Neural networks K1 Predictive models K1 Very large scale integration K1 Software K1 multi-segment wires K1 BPNN SP 340 OP 344 LK http://dx.doi.org/https://doi.org/10.1109/ISEDA59274.2023.10218655 DO https://doi.org/10.1109/ISEDA59274.2023.10218655 SF ELIB - SuUB Bremen
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